Modern active devices are designed for early childhood implantation and 100-year periods of use. In order to ensure compliance with these requirements already during development, accelerated testing must be employed. Whilst exposure to higher temperatures has been a working solution for many applications, thin-film polymer devices face reliability limits with a pure temperature increase.
To solve this problem nonetheless, we develop new test methods that make use of a multi-parameter model with elevated pressure and artificial body fluids at high concentrations. By setting up mathematical modeling in parallel, we can provide the desired long-term life span forecasts with acceptable accuracy.